Quasi-optical (sub-terahertz) setup for measuring the refractive indices of optical materials

Fig. 1. The schema of the quasi-optical setup (a) to measure the refractive indices of optical materials and the general view; refraction of electromagnetic waves in the sample (sinφ / sinφ '= n) (b); schematic representation of the interferometric fridge shift by rotating the sample from initial angular position (φ = φ1) to the final position (φ = φ2) (c)

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