Interferometric setup to study the electro-optic effect in crystalline materials

Fig. 1. The general view of the equipment for measurements of electro-optic coefficients on the base of Michelson interferometer

Fig. 2. The scheme of the equipment for measurements of electro-optic coefficients on the base of Michelson interferometer

© Center of Excellence for Innovative Technologies and NanoEngineering

Address: Ukraine, Lviv, 5 Kn. Romana str., Office 620

Tel/Fax: +38(032)258-30-82, email: anatolii.s.andrushchak@lpnu.ua